Superseded Standard

IEEE 1149.1-1990

IEEE Standard Test Access Port and Boundary-Scan Architecture

Circuitry that may be built into an integrated circuit to assist in the test, maintenance, and support of assembled printed circuit boards is defined. The circuitry includes a standard interface through which instructions and test data are communicated. A set of test features is defined, including a boundary-scan register, such that the component is able to respond to a minimum set of instructions designed to assist with testing of assembled printed circuit boards.

Sponsor Committee
C/TT - Test Technology
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Status
Superseded Standard
Superseded by
1149.1-2001
Amendments
1149.1a-1993
1149.1b-1994
Board Approval
1990-02-15
History
ANSI Approved:
1990-08-17
Published:
1990-05-21

Working Group Details

Society
IEEE Computer Society
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Sponsor Committee
C/TT - Test Technology
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No Active Projects
No Active Standards
No Superseded Standards
No Inactive-Withdrawn Standards
No Inactive-Reserved Standards
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