Inactive-Withdrawn Standard

IEEE 1181-1991

IEEE Recommended Practice for Latchup Test Methods for CMOS and BiCMOS Integrated- Circuit Process Characterization

Withdrawn Standard. Withdrawn Date: Mar 06, 2000. No longer endorsed by the IEEE. Recommendations are provided for the layout and test methods required to characterize properly latchup behavior in CMOS and BiCMOS integrated circuit processes or other processes that have similar lateral PNPN topographical layout characteristics. The aim is to allow the characterization of an integrated circuit process architecture so that different approaches can be scientifically compared. This allows the evaluation of the process capabilities on a worst-case recommended structure and test method independent of an actual integrated circuit product topographical latchup layout practices. Test structures and test philosophy are covered.

Sponsor Committee
EDS -
Status
Inactive-Withdrawn Standard
Board Approval
1991-06-27
History
Withdrawn:
2000-03-06
ANSI Approved:
1991-12-12
Published:
1991-12-13

Working Group Details

Society
IEEE Electron Devices Society
Sponsor Committee
EDS -
No Active Projects
No Active Standards
No Superseded Standards
No Inactive-Withdrawn Standards
No Inactive-Reserved Standards
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