The material presented in this standard is intended to provide common terminology and test methods for the testing and evaluation of analog-to-digital converters (ADCs). This standard considers only those ADCs whose output values have discrete values at discrete times, i.e., they are quantized and sampled. In general, this quantization is assumed to be nominally uniform (the input-output transfer curve is approximately a straight line) as discussed further in 1.3, Analog-to-digital converter background, and the sampling is assumed to be at a nominally uniform rate. Some but not all of the test methods in this standard can be used for ADCs that are designed for non-uniform quantization.
- Sponsor Committee
- IM/WM&A - TC10 - Waveform Generation Measurement and Analysis
Learn More - Status
- Inactive-Reserved Standard
- PAR Approval
- 2009-12-09
- Superseding
- 1241-2000
- Board Approval
- 2010-06-17
- History
-
- ANSI Approved:
- 2011-01-04
- Published:
- 2011-01-14
- Inactivated Date:
- 2021-03-25
Working Group Details
- Society
- IEEE Instrumentation and Measurement Society
Learn More - Sponsor Committee
- IM/WM&A - TC10 - Waveform Generation Measurement and Analysis
Learn More - Working Group
-
ADC - Working Group for Analog-to-Digital Converters
Learn More - IEEE Program Manager
- Vanessa Lalitte
Contact - Working Group Chair
- Steven Tilden
P1241
IEEE Draft Standard for Terminology and Test Methods for Analog-to-Digital Converters
The material presented in this standard is intended to provide common terminology and test methods for the testing and evaluation of analog-to-digital converters (ADCs). This standard considers only those ADCs whose output values have discrete values at discrete times, i.e., they are quantized and sampled. In general, this quantization is assumed to be nominally uniform (the input-output transfer curve is approximately a straight line) as discussed further in 1.3, and the sampling is assumed to be at a nominally uniform rate. Some but not all of the test methods in this standard can be used for ADCs that are designed for nonuniform quantization.
No Active Standards
No Superseded Standards
No Inactive-Withdrawn Standards
No Inactive-Reserved Standards