Inactive-Reserved Standard

IEEE 1450.6.1-2009

IEEE Standard for Describing On-Chip Scan Compression

This standard defines how the necessary information is passed from scan insertion to pattern generation and from pattern generation to diagnosis such that different tool vendors could be used for each step independent of on-chip scan compression logic used.

Sponsor Committee
C/TT - Test Technology
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Status
Inactive-Reserved Standard
PAR Approval
2007-02-27
Board Approval
2009-05-13
History
ANSI Approved:
2009-11-09
Published:
2009-07-13
Inactivated Date:
2020-03-05

Working Group Details

Society
IEEE Computer Society
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Sponsor Committee
C/TT - Test Technology
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Working Group
OCI - Standard For Describing On-chip Scan Compression
IEEE Program Manager
Tom Thompson
Contact
Working Group Chair
Bruce Cory
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