This standard defines how the necessary information is passed from scan insertion to pattern generation and from pattern generation to diagnosis such that different tool vendors could be used for each step independent of on-chip scan compression logic used.
- Sponsor Committee
- C/TT - Test Technology
Learn More - Status
- Inactive-Reserved Standard
- PAR Approval
- 2007-02-27
- Board Approval
- 2009-05-13
- History
-
- ANSI Approved:
- 2009-11-09
- Published:
- 2009-07-13
- Inactivated Date:
- 2020-03-05
Working Group Details
- Society
- IEEE Computer Society
Learn More - Sponsor Committee
- C/TT - Test Technology
Learn More - Working Group
-
OCI - Standard For Describing On-chip Scan Compression
Learn More - IEEE Program Manager
- Tom Thompson
Contact - Working Group Chair
- Bruce Cory
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