Active PAR

P1450

Standard Test Interface Language (STIL) for Digital Test Vector Data

This standard defines a test description language that: a) Facilitates the transfer of large volumes of digital test vector data from computer-aided engineering (CAE) environments to automated test equipment (ATE) environments; b) Specifies pattern, format, and timing information sufficient to define the application of digital test vectors to a device under test (DUT); c) Supports the volume of test vector data generated from structured tests such as scan/automatic test pattern generation (ATPG), integral test techniques such as built-in self test (BIST), and functional test specifications for IC designs and their assemblies, in a format optimized for application in ATE environments.

Sponsor Committee
C/TT - Test Technology
Learn More
Status
Active PAR
PAR Approval
2020-12-03
Superseding
1450-1999

Working Group Details

Society
IEEE Computer Society
Learn More
Sponsor Committee
C/TT - Test Technology
Learn More
Working Group
STIL_WG - Standard Test Interface Language Working Group
Learn More
IEEE Program Manager
Tom Thompson
Contact
Working Group Chair
Ric Dokken
No Active Projects
No Active Standards
No Superseded Standards
No Inactive-Withdrawn Standards
No Inactive-Reserved Standards
Newswire

Sign up for our monthly newsletter to learn about new developments, including resources, insights and more.