Active PAR


Standard Test Interface Language (STIL) for Digital Test Vector Data

This standard defines a test description language that: a) Facilitates the transfer of large volumes of digital test vector data from computer-aided engineering (CAE) environments to automated test equipment (ATE) environments; b) Specifies pattern, format, and timing information sufficient to define the application of digital test vectors to a device under test (DUT); c) Supports the volume of test vector data generated from structured tests such as scan/automatic test pattern generation (ATPG), integral test techniques such as built-in self test (BIST), and functional test specifications for IC designs and their assemblies, in a format optimized for application in ATE environments.

Sponsor Committee
C/TT - Test Technology
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Active PAR
PAR Approval

Working Group Details

IEEE Computer Society
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Sponsor Committee
C/TT - Test Technology
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Working Group
STIL_WG - Standard Test Interface Language Working Group
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IEEE Program Manager
Tom Thompson
Working Group Chair
Ric Dokken
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