This standard defines a mechanism for the test of core designs within a system on chip (SoC). This mechanism constitutes a hardware architecture and leverages the core test language (CTL) to facilitate communication between core designers and core integrators.
- Sponsor Committee
- C/TT - Test Technology
Learn More - Status
- Inactive-Reserved Standard
- PAR Approval
- 1997-06-27
- Superseded by
- 1500-2022
- Board Approval
- 2005-03-20
- History
-
- ANSI Approved:
- 2005-06-30
- Published:
- 2005-08-29
- Reaffirmed:
- 2011-03-31
- Inactivated Date:
- 2022-03-24
Working Group Details
- Society
- IEEE Computer Society
Learn More - Sponsor Committee
- C/TT - Test Technology
Learn More - Working Group
-
ADMIN_8220 - Project Administration_8220
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No Active Standards
1532-2000
IEEE Standard for In-System Configuration of Programmable Devices
The communication protocol described by IEEE Std 1149.1 TM -2001 (Standard Test Access Port and Boundary-Scan Architecture) has been adopted by this standard for providing standardized programming access and methodology for programmable integrated circuit devices.Devices that implement this standard will first be compliant with IEEE Std 1149.1-2001, which isused for testing purposes. A device, or set of devices, implementing this standard can be pro-grammed (written), read back, erased, and verified, singly or concurrently, with a standardized setof resources. Sample implementation and application details (which are not part of this standard)are included for illustrative purposes.
No Inactive-Withdrawn Standards
1450.1-2005
IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std 1450-1999) for Semiconductor Design Environments
Replaced by IEC 62526 Ed. 1 (2007-11. Standard Test Interface Language (STIL) provides an interface between digital test generation tools and test equipment. Extensions to the test interface language (contained in this standard) are defined that (1) facilitate the use of the language in the design environment and (2) facilitate the use of the language for large designs encompassing subdesigns with reusable patterns.
1450.2-2002
IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std 1450-1999) for DC Level Specification
Define structures in STIL for specifying the DC conditions for a device under test. Examples of the DC conditions for device power supplies are: device power supply setup, power sequencing to the device, power supply limit
1450.3-2007
IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std. 1450-1999) for Tester Target Specification
The STIL environment supports transferring tester-independent test programs to a specific ATE system. Although native STIL data are tester independent, the actual process of mapping the test program onto tester resources may be critical, and it is necessary to be able to completely and unambiguously specify how the STIL programs and patterns are mapped onto the tester resources. TRC (which stands for either tester resource constraints or tester rules checking, depending on the usage) is an extension to the STIL language to facilitate this operation.