Active Standard

IEEE 1505.1-2019

IEEE Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505

An extension to the IEEE 1505TM receiver fixture interface (RFI) standard specification is provided in this standard. Particular emphasis is placed on defining within the IEEE 1505 RFI standard a more specific set of performance requirements that employ a common scalable: 1) pin map configuration; 2) specific connector modules; 3) respective contacts; 4) recommended switching implementation; and 5) legacy automatic test equipment (ATE) transitional devices. This is intentionally done to standardize the footprint and assure mechanical and electrical interoperability between past and future automatic test systems (ATS).

Sponsor Committee
SASB/SCC20 - SCC20 - Test and Diagnosis for Electronic Systems
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Status
Active Standard
PAR Approval
2015-12-05
Superseding
1505.1-2008
Board Approval
2019-06-13
History
Published:
2019-08-20

Working Group Details

Society
IEEE-SASB Coordinating Committees
Sponsor Committee
SASB/SCC20 - SCC20 - Test and Diagnosis for Electronic Systems
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Working Group
p1505.1 - p1505.1 CTI Physical Pin Map Configuration Utilizing 1505 Std
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IEEE Program Manager
Christian Orlando
Contact
Working Group Chair
Robert Spinner
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