This standard describes a method for characterizing organic electronic devices, including measurement techniques, methods of reporting data, and the testing conditions during characterization.
- Sponsor Committee
- C/MSC - Microprocessor Standards Committee
Learn More - Status
- Superseded Standard
- PAR Approval
- 2003-06-12
- Superseded by
- 1620-2008
- Board Approval
- 2004-02-09
- History
-
- ANSI Approved:
- 2004-05-12
- Published:
- 2004-04-29
Working Group Details
- Society
- IEEE Computer Society
Learn More - Sponsor Committee
- C/MSC - Microprocessor Standards Committee
Learn More - Working Group
-
1620_WG - Working Group for Organic and Molecular Electronics
Learn More - IEEE Program Manager
- Tom Thompson
Contact - Working Group Chair
- Daniel Gamota
No Active Projects
1620.1-2006
IEEE Standard for Test Methods for the Characterization of Organic Transistor-Based Ring Oscillators
Recommended methods and standardized reporting practices for electrical characterization of printed and organic ring oscillators are covered. Due to the nature of printed and organic circuits, significant measurement errors can be introduced if the electrical characterization design-of-experiment is not properly addressed. This standard describes the most common sources of measurement error, particularly for high-impedance electrical measurements commonly required for printed and organic ring oscillators. This standard also gives recommended practices in order to minimize and/or characterize the effect of measurement artifacts and other sources of error encountered while measuring printed and organic ring oscillators.
No Superseded Standards
No Inactive-Withdrawn Standards
1620-2008
IEEE Standard for Test Methods for the Characterization of Organic Transistors and Materials
This standard describes a method for characterizing organic electronic devices, including measurement techniques, methods of reporting data, and the testing conditions during characterization. Adopted by IEC as IEC 62860 Edition 1.0 2013-07.