Terminology and test methods to clearly document prevalent world-wide terms used to describe and test digital-to-analog converters (DACs) are provided. It is restricted to monolithic, hybrid, and module DACs and does not cover systems encompassing DACs.
- Sponsor Committee
- IM/WM&A - TC10 - Waveform Generation Measurement and Analysis
Learn More - Status
- Inactive-Reserved Standard
- PAR Approval
- 2011-03-31
- Board Approval
- 2011-10-31
- History
-
- ANSI Approved:
- 2012-12-10
- Published:
- 2012-02-10
- Inactivated Date:
- 2022-03-24
Working Group Details
- Society
- IEEE Instrumentation and Measurement Society
Learn More - Sponsor Committee
- IM/WM&A - TC10 - Waveform Generation Measurement and Analysis
Learn More - Working Group
-
DAC - Digital-to-Analog Converter Devices
Learn More - IEEE Program Manager
- Vanessa Lalitte
Contact - Working Group Chair
- Luca De Vito
P1658
Standard for Terminology and Test Methods of Digital-to-Analog Converter Devices
This standard defines terminology and test methods to clearly document prevalent world-wide terms used to describe and test digital-to-analog converters (DACs). It is restricted to monolithic, hybrid, and module DACs and does not cover systems encompassing DACs.
No Active Standards
No Superseded Standards
No Inactive-Withdrawn Standards
No Inactive-Reserved Standards