This standard defines terminology and test methods to clearly document prevalent world-wide terms used to describe and test digital-to-analog converters (DACs). It is restricted to monolithic, hybrid, and module DACs and does not cover systems encompassing DACs.
- Sponsor Committee
- IM/WM&A - TC10 - Waveform Generation Measurement and Analysis
Learn More - Status
- Active PAR
- PAR Approval
- 2018-06-14
- Superseding
- 1658-2011
Working Group Details
- Society
- IEEE Instrumentation and Measurement Society
Learn More - Sponsor Committee
- IM/WM&A - TC10 - Waveform Generation Measurement and Analysis
Learn More - Working Group
-
DAC - Digital-to-Analog Converter Devices
Learn More - IEEE Program Manager
- Vanessa Lalitte
Contact - Working Group Chair
- Luca De Vito
No Active Projects
No Active Standards
No Superseded Standards
No Inactive-Withdrawn Standards
1658-2011
IEEE Standard for Terminology and Test Methods of Digital-to-Analog Converter Devices
Terminology and test methods to clearly document prevalent world-wide terms used to describe and test digital-to-analog converters (DACs) are provided. It is restricted to monolithic, hybrid, and module DACs and does not cover systems encompassing DACs.