This standard defines an exchange format, utilizing Extensible Markup Language (XML), for specifying test performance, test conditions, diagnostic requirements, and support equipment to locate, align, and verify the proper operation of a unit under test (UUT). This is in support of the life cycle of test program sets (TPSs) that will be used in an automatic test environment.
- Sponsor Committee
- SASB/SCC20 - SCC20 - Test and Diagnosis for Electronic Systems
Learn More - Status
- Active PAR
- PAR Approval
- 2019-11-07
Working Group Details
- Society
- IEEE-SASB Coordinating Committees
- Sponsor Committee
- SASB/SCC20 - SCC20 - Test and Diagnosis for Electronic Systems
Learn More - Working Group
-
1671.1_Cor1 - IEEE 1671.1 Corrigendum 1 WG
Learn More - IEEE Program Manager
- Christian Orlando
Contact - Working Group Chair
- Ion Neag
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