Active PAR

P1687

Standard for Access and Control of Instrumentation Embedded within a Semiconductor Device

This standard defines a methodology for access to and operation of embedded instrumentation, without defining the instruments or their features themselves, via one or more well-specified digital interfaces. Some of these interfaces are suitable to be hosted under the IEEE 1149.1 Test Access Port (TAP). The principal elements of the standard are the access architecture and two description language components: one is for describing the connectivity of the instruments, the network containing them, and the behavior of their interfaces to this network; the other is for describing the communication and interaction with the instruments.

Sponsor Committee
C/TT - Test Technology
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Status
Active PAR
PAR Approval
2022-03-24
Superseding
1687-2014

Working Group Details

Society
IEEE Computer Society
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Sponsor Committee
C/TT - Test Technology
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Working Group
IJTAG - Internal Joint Test Action Group
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IEEE Program Manager
Tom Thompson
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1687-2014

IEEE Standard for Access and Control of Instrumentation Embedded within a Semiconductor Device

A methodology for accessing instrumentation embedded within a semiconductor device, without defining the instruments or their features themselves, via the IEEE 1149.1(TM) test access port (TAP) and/or other signals, is described in this standard. The elements of the methodology include a hardware architecture for the on-chip network connecting the instruments to the chip pins, a hardware description language to describe this network, and a software language and protocol for communicating with the instruments via this network.

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