Active Standard

IEEE 1687-2014

IEEE Standard for Access and Control of Instrumentation Embedded within a Semiconductor Device

A methodology for accessing instrumentation embedded within a semiconductor device, without defining the instruments or their features themselves, via the IEEE 1149.1(TM) test access port (TAP) and/or other signals, is described in this standard. The elements of the methodology include a hardware architecture for the on-chip network connecting the instruments to the chip pins, a hardware description language to describe this network, and a software language and protocol for communicating with the instruments via this network.

Sponsor Committee
C/TT - Test Technology
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Status
Active Standard
PAR Approval
2006-03-16
Board Approval
2014-11-03
History
Published:
2014-12-05

Working Group Details

Society
IEEE Computer Society
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Sponsor Committee
C/TT - Test Technology
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Working Group
IJTAG - Internal Joint Test Action Group
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IEEE Program Manager
Tom Thompson
Contact
Working Group Chair
Ian Mcintosh
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