This standard provides test method(s) and describes transfer (artifact) standards for characterizing electrical circuit probes and probes systems. The systems may include waveform acquisition hardware and software and signal/waveform analysis software. The probe includes the mechanism by which the circuit is contacted. This method and standard applies to all individual probes having one signal conductor and one ground conductor or two signal conductors, and having an input impedance greater than the impedance of the circuit under test.
- Sponsor Committee
- IM/WM&A - TC10 - Waveform Generation Measurement and Analysis
Learn More - Status
- Active PAR
- PAR Approval
- 2021-02-10
- Superseding
- 1696-2013
Working Group Details
- Society
- IEEE Instrumentation and Measurement Society
Learn More - Sponsor Committee
- IM/WM&A - TC10 - Waveform Generation Measurement and Analysis
Learn More - Working Group
-
Probe - Subcommittee on Probe Standards
Learn More - IEEE Program Manager
- Vanessa Lalitte
Contact - Working Group Chair
- John Jendzurski
No Active Projects
1696-2013
IEEE Standard for Terminology and Test Methods for Circuit Probes
Currently, no defined, industry-accepted method exists for characterizing the performance of electrical circuit probes. Each vendor has its own proprietary methods for characterization, leaving probe customers and users without a valid means of comparing probe performance and/or of understanding the circuit-loading effect of the probe. Methods for measuring parameters indicative of a probe's or probe system's performance and guidance on the design and use of a test fixture for measuring probe performance are provided by this standard. An industry-accepted, unbiased means for characterizing probe performance is given by these methods. High-impedance voltage probes that are used to measure the performance of electrical circuits are considered by this standard. The probe systems may include waveform acquisition hardware and software and signal/waveform analysis software. The probe will include the mechanism by which the circuit is contacted. This method and standard will be applicable to all individual probes having one signal conductor and one ground conductor or two signal conductors, and having an input impedance at least five times greater than the impedance of the circuit under test.
No Superseded Standards
No Inactive-Withdrawn Standards
No Inactive-Reserved Standards