Active PAR

P2665

Recommended Practice for Statistical Process Control for EMC Test Laboratories

Guidance for the determination of the repeatability of Electromagnetic Compatibility (EMC) test method results through the specialized use of statistical process controls and setups which are designed to verify test equipment performance by producing appropriate historical 'X Bar' and 'Range' charts that clearly document system behavior.

Sponsor Committee
EMC/SDCom - Standards Development Committee
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Status
Active PAR
PAR Approval
2017-12-06

Working Group Details

Society
IEEE Electromagnetic Compatibility Society
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Sponsor Committee
EMC/SDCom - Standards Development Committee
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Working Group
SPC for EMC Testing - Statistical Process Control for EMC Test Laboratories
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IEEE Program Manager
Jennifer Santulli
Contact
Working Group Chair
Kimball Williams
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No Inactive-Withdrawn Standards
No Inactive-Reserved Standards
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