Guidance for the determination of the repeatability of Electromagnetic Compatibility (EMC) test method results through the specialized use of statistical process controls and setups which are designed to verify test equipment performance by producing appropriate historical 'X Bar' and 'Range' charts that clearly document system behavior.
- Sponsor Committee
- EMC/SDCom - Standards Development Committee
Learn More - Status
- Active PAR
- PAR Approval
- 2017-12-06
Working Group Details
- Society
- IEEE Electromagnetic Compatibility Society
Learn More - Sponsor Committee
- EMC/SDCom - Standards Development Committee
Learn More - Working Group
-
SPC for EMC Testing - Statistical Process Control for EMC Test Laboratories
Learn More - IEEE Program Manager
- Jennifer Santulli
Contact - Working Group Chair
- Kimball Williams
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No Active Standards
No Superseded Standards
No Inactive-Withdrawn Standards
No Inactive-Reserved Standards