Active PAR


Reliability Component Stress Analysis and Derating Specification

This specification establishes uniform methods to increase electronic, electrical, or electromechanical product reliability by decreasing the amount of applied stress (i.e., voltage, current, temperature, power, etc.) to components within the system.

Sponsor Committee
RS/SC - IEEE Reliability
Active PAR
PAR Approval

Working Group Details

IEEE Reliability Society
Learn More
Sponsor Committee
RS/SC - IEEE Reliability
Working Group
Derating - Reliability Stress Analysis and Derating Working Group
Learn More
IEEE Program Manager
Christian Orlando
Working Group Chair
Lori Bechtold
No Active Projects
No Active Standards
No Superseded Standards
No Inactive-Withdrawn Standards
No Inactive-Reserved Standards

Sign up for our monthly newsletter to learn about new developments, including resources, insights and more.