Active PAR

P3138

Standard for General Requirements of Chip Visual Inspection in Surface Mount Industry

This standard specifies the general requirements of visual inspection of surface mount devices (SMD) for surface mount technology (SMT) machines, including the format of chip parameters data exchange, the function and technical requirements of each module of the visual inspection algorithm, and the storage structure of chip parameters. This standard specifies unified data format and interfaces of the algorithms between different SMT machines.

Sponsor Committee
IES/IES - Industrial Electronics Society Standards Committee
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Status
Active PAR
PAR Approval
2021-12-08

Working Group Details

Society
IEEE Industrial Electronics Society
Sponsor Committee
IES/IES - Industrial Electronics Society Standards Committee
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Working Group
CVISMI - Chips Visual Inspection in Surface Mount Industry
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IEEE Program Manager
Vanessa Lalitte
Contact
Working Group Chair
Xianqiang Yang
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