Active Standard

IEEE/IEC 61671-4-2016

IEC/IEEE International Standard - Standard for Automatic Test Markup Language (ATML) Test Configuration

An exchange format is specified in this standard, using extensible markup language (XML), for identifying the test configuration used to test for and diagnose faults of a unit under test (UUT) on an automatic test system (ATS).

Sponsor Committee
SASB/SCC20 - SCC20 - Test and Diagnosis for Electronic Systems
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Status
Active Standard
Adoption of
1671.4-2014
History
Published:
2016-04-08

Working Group Details

Society
IEEE-SASB Coordinating Committees
Sponsor Committee
SASB/SCC20 - SCC20 - Test and Diagnosis for Electronic Systems
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