Active Standard

IEEE/IEC 62526-2007

IEC 62526 Ed. 1 (IEEE Std 1450.1(TM)-2005): Standard for Extensions to Standard Test Interface Language (STIL) for Semiconductor Design Environments

Standard Test Interface Language (STIL) provides an interface between digital test generation tools and test equipment. Extensions to the test interface language (contained in this standard) are defined that (1) facilitate the use of the language in the design environment and (2) facilitate the use of the language for large designs encompassing subdesigns with reusable patterns.

Sponsor Committee
C/TT - Test Technology
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Status
Active Standard
History
Published:
2007-12-09

Working Group Details

Society
IEEE Computer Society
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Sponsor Committee
C/TT - Test Technology
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