Superseded Standard

IEEE/IEC 62528-2007

IEC 62528 Ed. 1 (IEEE Std 1500(TM)-2005): Standard Testability Method for Embedded Core-based Integrated Circuits

Replaced IEEE Std 1500-2005. This standard defines a mechanism for the test of core designs within a system on chip(SoC). This mechanism constitutes a hardware architecture and leverages the core test language(CTL) to facilitate communication between core designers and core integrators.

Sponsor Committee
C/TT - Test Technology
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Status
Superseded Standard
History
Published:
2007-12-09

Working Group Details

Society
IEEE Computer Society
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Sponsor Committee
C/TT - Test Technology
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