Inactive-Withdrawn Standard

IEEE 660-1986

IEEE Standard for Semiconductor Memory Test Pattern Language

The scope of this standard is the definition of a descriptive language, including vocabulary and grammar, to describe functional test sequences (also called patterns) for memory devices.

Sponsor Committee
C/TT - Test Technology
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Status
Inactive-Withdrawn Standard
Board Approval
1985-09-19
History
Withdrawn:
1995-05-05
ANSI Approved:
1986-02-01
Published:
1986-02-18

Working Group Details

Society
IEEE Computer Society
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Sponsor Committee
C/TT - Test Technology
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No Active Projects
No Active Standards
No Superseded Standards
No Inactive-Withdrawn Standards
No Inactive-Reserved Standards
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