The scope of this standard is the definition of a descriptive language, including vocabulary and grammar, to describe functional test sequences (also called patterns) for memory devices.
- Sponsor Committee
- C/TT - Test Technology
Learn More - Status
- Inactive-Withdrawn Standard
- Board Approval
- 1985-09-19
- History
-
- Withdrawn:
- 1995-05-05
- ANSI Approved:
- 1986-02-01
- Published:
- 1986-02-18
Working Group Details
- Society
- IEEE Computer Society
Learn More - Sponsor Committee
- C/TT - Test Technology
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