A language useful for describing Automatic Test Equipment (ATE) instrumentation and configurations, as well as Interface Test Adapters (ITA), is defined. Principally intended for testing environments using the ATLAS test language, TEDL can also be used to describe instrumentation in non-ATLAS environments.
- Sponsor Committee
- SASB/SCC20 - SCC20 - Test and Diagnosis for Electronic Systems
Learn More - Status
- Inactive-Withdrawn Standard
- Board Approval
- 1997-03-20
- History
-
- Withdrawn:
- 2003-02-07
- ANSI Approved:
- 1997-12-04
- Published:
- 1997-06-19
Working Group Details
- Society
- IEEE-SASB Coordinating Committees
- Sponsor Committee
- SASB/SCC20 - SCC20 - Test and Diagnosis for Electronic Systems
Learn More
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