Superseded Standard

IEEE C37.26-2003

IEEE Guide for Methods of Power-Factor Measurement for Low-Voltage Inductive Test Circuits

This guide provides methods for determining the value of power factor for inductive low-voltage (1000 volts ac and below) test circuits. These methods are used in determining power factor during short-circuit current tests in high power laboratories. It is preferred that these methods be used during short-circuit current testing. Alternatively, other methods (including use of computerized or digital techniques) may be used, but the method used must have been validated as producing results equivalent to those obtained using the methods in this guide. The methods described are intended for use in low-voltage test circuits (under 1000 volts ac), but may also be used for higher voltages.

Sponsor Committee
PE/SWG - Switchgear
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Status
Superseded Standard
PAR Approval
2002-12-11
Superseded by
C37.26-2014
Superseding
C37.26-1972
Board Approval
2003-09-11
History
ANSI Approved:
2003-12-29
Published:
2004-02-26
Reaffirmed:
2009-03-19

Working Group Details

Society
IEEE Power and Energy Society
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Sponsor Committee
PE/SWG - Switchgear
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Working Group
LVSD-WG_C37.26 - LVSD - IEEE Guide for Methods of Power-Factor Measurement for Low-Voltage Inductive Test Circuits
IEEE Program Manager
Ashley Moran
Contact
Working Group Chair
T W Olsen
No Active Projects

C37.26-2014

IEEE Guide for Methods of Power-Factor Measurement for Low-Voltage (1000 V AC or lower) Inductive Test Circuits

Methods for determining the value of the power factor for inductive low-voltage (1000 V ac and lower) test circuits are provided. These methods are used in determining the power factor during short-circuit current tests in high-power laboratories. It is preferred that these methods be used during short-circuit current testing. Alternatively, other methods (including use of computerized or digital techniques) may be used, but the method used shall have been validated as producing results equivalent to those obtained using the methods in this guide. The methods described are intended for use in low-voltage test circuits (under 1000 V ac) but may also be used for higher voltages.

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No Superseded Standards
No Inactive-Withdrawn Standards
No Inactive-Reserved Standards
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