Inactive-Withdrawn Standard

IRE/IEEE IRE28.S2-1956

IRE Standards on Solid State Devices: Methods of Testing Transistors, 1956

This standard deals with the methods of measurement of important characteristics of transistors. In general, these characteristics are referred to as parameters of the devices. Because of the youthfulness of the transistor art, methods of testing transistors will continue to change considerably before the art can be considered to have stabilized sufficiently for complete standardization. This standard corresponds to the current state of transistor testing methods, and its publication by the IRE is considered preferable to waiting for a future stabilization of the many rapid changes now characteristic of this field

Status
Inactive-Withdrawn Standard
Board Approval
1956-07-01

Working Group Details

No Active Projects
No Active Standards
No Superseded Standards
No Inactive-Withdrawn Standards
No Inactive-Reserved Standards
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