Tag: Diode


This standard defines a defect coverage accounting method based on simulation models for defects observed within integrated circuits (ICs). The portion of all possible defects that are detected, or "covered", by tests of analog and mixed-signal circuits depends, in practice, on many factors (detectability, defect characteristics, detection threshold margin, measurement resolution, operating point, test patterns, etc.), which this standard considers as it defines how to report coverage. This standard focuses on defects in analog functions. In this context, "defect" is an observable unintended physical change in a circuit, and an "analog function" means a function that has input, internal, or…

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