Tag: IEEE 1149

TI Pins-Down and Debugs

Something old and something new! Texas Instruments is showing the industry how old standards pave way for new technology. As products evolve, so does the circuitry inside. The smaller the…

The Story of IEEE 1149.7 – Less Red Tape, More Rigor!

Last year’s publication of IEEE Std 1149.7™, “IEEE Standard for Reduced-pin and Enhanced-functionality Test Access Port and Boundary Scan Architecture,” (often called JTAG) was the result of several years of…

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