Tag: Industry Applications

IEEE Recommended Practice for Estimating the Costs of Industrial and Commercial Power Systems

Described in this recommended practice are methods for estimating the costs of industrial and commercial power systems, both new and those undergoing expansion or modernization. This recommended practice is restricted…

IEEE Standard for Design and Verification of Low-Power, Energy-Aware Electronic Systems

A method is provided for specifying power intent for an electronic design, for use in verification of the structure and behavior of the design in the context of a given…

IEC/IEEE International Standard for Automatic Test Markup Language (ATML) Instrument Description

An exchange format is specified in this standard, using extensible markup language (XML), for identifying instrumentation that may be integrated in an automatic test system (ATS) that is to be…

IEC/IEEE International Standard – Standard for Automatic Test Markup Language (ATML) Test Configuration

An exchange format is specified in this standard, using extensible markup language (XML), for identifying the test configuration used to test for and diagnose faults of a unit under test…

IEEE Standard for SystemVerilog–Unified Hardware Design, Specification, and Verification Language

The definition of the language syntax and semantics for SystemVerilog, which is a unified hardware design, specification, and verification language, is provided. This standard includes support for modeling hardware at…

IRE Standards on Solid State Devices: Measurement of Minority Carrier Lifetime in Germanium and Silicon by the Method of Photo Conductive Decay

This standard describes a particular method for measuring carrier lifetime, namely, that of photoconductive decay. Lifetime (volume) is defined as: the average time interval between the generation and recombination of…

IRE Standards on Solid-State Devices: Definitions of Semiconductor Terms 1960

Definitions of Semiconductor Terms, 1960

IEC/IEEE International standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505(TM)

This standard represents an extension to the IEEE 1505 receiver fixture interface (RFI) standard specification. Particular emphasis is placed on defining within the IEEE 1505 RFI standard a more specific…

IEEE Graphic Symbols for Logic Diagrams (Two State Devices)

This standard sets forth principles governing the formation of graphic symbols for logic diagrams in which the connections between symbols are generally shown with lines. Descriptions of logic functions, the…
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