Tag: Interlocking

P1687.2

This standard formalizes how to describe, in a way that extends IEEE 1687 ICL and PDL, retargetable access circuitry within an IC relevant to testing analog functions of the IC. The description is also relevant to insertion of such test access circuitry, to generation of tests using this access circuitry, and automating these tasks. Analog test access includes access to analog and digital signals; analog test control includes control of circuits under test (CUTs), control of test instruments within the IC, and control of the access paths between CUTs and test instruments, the latter including on- and off-chip instruments. The…
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