Tag: Measurement

PC57.98

The scope of this guide is the interpretation and application of the impulse testing requirements of the IEEE Standard Test Codes for Transformers.

P2427

This standard defines a defect coverage accounting method based on simulation models for defects observed within integrated circuits (ICs). The portion of all possible defects that are detected, or "covered",…

SMDC December 2020

New and revised projects put forth for approval by the Strategic Management and Delivery Committees.

SMDC March 2021

New and revised projects put forth for approval by the Strategic Management and Delivery Committees.
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